Characteristics of 3M Write-Once Archival Optical Storage Media

S. Lu; R. P. Freese; C. H. Chung; D. H. Davies; D. Evanicky; M. Alexander

doi:10.1117/12.936076

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10 November 1983 Characteristics of 3M Write-Once Archival Optical Storage Media

S. Lu; R. P. Freese; C. H. Chung; D. H. Davies; D. Evanicky; M. Alexander

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Proceedings Volume 0420, Optical Storage Media; (1983) https://doi.org/10.1117/12.936076
Event: 1983 Optical Mass Data Storage Conferences, 1983, Arlington, United States

Abstract

Recent efforts to improve the media sensitivity of optical recording have resulted in the development of various multi-layer constructions and in particular, the optically tuned anti-reflective trilayer configuration. In order to further enhance the recording sensitivity, many trilayer media use low melting materials such as tellurium or tellurium alloys for the light absorptive layer and/or a light transmissive layer that is easily sublimable, decomposable or vaporizable by the laser heat. In general, these materials compromise the media stability such that some form of environmental protection is required to ensure archival storage.

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S. Lu, R. P. Freese, C. H. Chung, D. H. Davies, D. Evanicky, and M. Alexander "Characteristics of 3M Write-Once Archival Optical Storage Media", Proc. SPIE 0420, Optical Storage Media, (10 November 1983); https://doi.org/10.1117/12.936076

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