10 November 1983 Characterization Of Optical Recording Disk Noise
Author Affiliations +
Proceedings Volume 0420, Optical Storage Media; (1983) https://doi.org/10.1117/12.936084
Event: 1983 Optical Mass Data Storage Conferences, 1983, Arlington, United States
Abstract
Various sources of noise on Te-alloy optical recording disks are isolated and examined. Examples of disks in which substrate, Te-alloy coating, or recording noise dominates are presented. When a Te-alloy medium is properly chosen to minimize its coating and writing noise, a disk using a typical polymethylmethacrylate substrate has a carrier-to-noise ratio in excess of 60dB with a 30KHz bandwidth. For these low noise Te-alloy based disks, the substrate noise dominates.
© (1983) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
M. Chen, M. Chen, A. E. Bell, A. E. Bell, V. Marrello, V. Marrello, } "Characterization Of Optical Recording Disk Noise", Proc. SPIE 0420, Optical Storage Media, (10 November 1983); doi: 10.1117/12.936084; https://doi.org/10.1117/12.936084
PROCEEDINGS
7 PAGES


SHARE
RELATED CONTENT

Barrier Coatings For Optical Recording Media
Proceedings of SPIE (May 26 1982)
Amorphous Te-C Films For An Optical Disk
Proceedings of SPIE (May 26 1982)
Silicon photonic bandgap biosensors
Proceedings of SPIE (September 12 2005)

Back to Top