10 November 1983 Comprehensive Model For The Simulation Of The Recording Performance Of Optical Storage Media
Author Affiliations +
Proceedings Volume 0420, Optical Storage Media; (1983); doi: 10.1117/12.936052
Event: 1983 Optical Mass Data Storage Conferences, 1983, Arlington, United States
Abstract
The thermal evolution in thin-film multilayer Optical Storage Media (OSM), upon exposure to a writing pulse, depends upon recording system parameters and both optical and thermal properties of the OSM. This paper presents a model of the process that accounts for the distribution of heat generated in the absorbing layers and both axial and transverse thermal diffusion. Once the physical characteristics of a mark generated in the OSM have been predicted, readback performance is modeled under various detection schemes and drive parameters.
© (1983) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Robert E. Revay, Fred W. Spong, Scott L. DeVore, "Comprehensive Model For The Simulation Of The Recording Performance Of Optical Storage Media", Proc. SPIE 0420, Optical Storage Media, (10 November 1983); doi: 10.1117/12.936052; https://doi.org/10.1117/12.936052
PROCEEDINGS
6 PAGES


SHARE
KEYWORDS
Reflectivity

Optical storage

Sensors

Process modeling

Optical analysis

Thermal modeling

Thin films

Back to Top