15 November 1983 A Frequency Domain Description Of Interferogram Analysis
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Proceedings Volume 0429, Precision Surface Metrology; (1983); doi: 10.1117/12.936356
Event: 27th Annual Technical Symposium, 1983, San Diego, United States
Abstract
Interferogram analysis is discussed as a sampling problem using the concepts of Fourier analysis. The relative merits of random, raster, and uniform sampling of a wavefront are examined. A relationship between a global least squares fit and interpolation in the spatial domain and transfer functions in the frequency domain is described.
© (1983) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Kenneth H. Womack, "A Frequency Domain Description Of Interferogram Analysis", Proc. SPIE 0429, Precision Surface Metrology, (15 November 1983); doi: 10.1117/12.936356; https://doi.org/10.1117/12.936356
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KEYWORDS
Wavefronts

Fringe analysis

Diffraction

Fourier transforms

Computer generated holography

Data centers

Optical filters

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