15 November 1983 AC Phase Measurement Technique For Moire Interferograms
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Proceedings Volume 0429, Precision Surface Metrology; (1983); doi: 10.1117/12.936338
Event: 27th Annual Technical Symposium, 1983, San Diego, United States
Abstract
This paper describes a method by which recorded moire interferograms of diffuse, non optical surfaces may be processed using the principle of optical phase measurement by AC interferometry. In this method, a moire interferogram is recorded and processed as a transparency. The resulting interferogram is equivalent to a low spatial frequency optical hologram. An optical wavefront whose phase variations can be reconstructed from a plane wavefront and interfered with a second coherent plane wavefront of slightly different optical frequency, resulting in an interferogram appropriate for measurement by temporal electronic phase measurement. The results compare favorably to direct contact measurements.
© (1983) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
R. N. Shagam, "AC Phase Measurement Technique For Moire Interferograms", Proc. SPIE 0429, Precision Surface Metrology, (15 November 1983); doi: 10.1117/12.936338; https://doi.org/10.1117/12.936338
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KEYWORDS
Wavefronts

Phase measurement

Moire patterns

Transparency

Heterodyning

Interferometers

Sensors

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