Small Angle Bidirectional Reflectance Distribution Function (BRDF) at 10 Âµm

Wallace K. Wong

doi:10.1117/12.936385

19 January 1984 Small Angle Bidirectional Reflectance Distribution Function (BRDF) at 10 µm

Wallace K. Wong

Proceedings Volume 0430, Infrared Technology IX; (1984) https://doi.org/10.1117/12.936385
Event: 27th Annual Technical Symposium, 1983, San Diego, United States

Abstract

The Sensor Systems Group (SSG), Inc., has been routinely using a BRDF measurement as an acceptance test for low scatter mirrors for use in high straylight rejection telescopes. Our conventional 10.6 μm BRDF measurement apparatus can characterize a low scatter sample from -5° to -50° off specular using a sampling ΩFOV of 2.2 X 10-4 sr. Recently, this apparatus was modified to allow successful measurement of a 24-inch focal length low scatter off-axis parabola from 0.5Ã‚Â° to 5Ã‚Â° off specular using a sampling QFOV of 1.2 X 10-5 sr. The measured BRDF data on this particular sample at 0.5, 1.0, 2.0 and 5.0 degrees are 6.5 X 10-4, 2.1 X 10-4, 6.7 X 10-5 and 1.5 X 10-5 per sr, respectively. The test configuration and design issues are described in this paper.

Citation Download Citation

Wallace K. Wong "Small Angle Bidirectional Reflectance Distribution Function (BRDF) at 10 µm", Proc. SPIE 0430, Infrared Technology IX, (19 January 1984); https://doi.org/10.1117/12.936385

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