Use Of Monte-Carlo Analysis In Estimating Yields Of Acceptable Infrared Detector Array Modules

Paul E. Thurlow

doi:10.1117/12.936398

19 January 1984 Use Of Monte-Carlo Analysis In Estimating Yields Of Acceptable Infrared Detector Array Modules

Paul E. Thurlow

Proceedings Volume 0430, Infrared Technology IX; (1984) https://doi.org/10.1117/12.936398
Event: 27th Annual Technical Symposium, 1983, San Diego, United States

Abstract

Production yield of acceptable focal plane infrared (IR) arrays may be minimal when performance specifications are severe. When anticipated yields are orders of magnitude below unity, the ability to estimate yields, and to identify production factors which can improve yields, assumes a particular importance. Since production yields as a function of focal plane array parameters cannot normally be computed analytically, empirical statistical methods must be developed, based primarily on numerical modeling and simulation, and confirmed by available spot-check measurements. This paper describes one method of estimating array yields, using a monte-carlo approach to model individual and combined photodiode performance in a statistical manner.

Citation Download Citation

Paul E. Thurlow "Use Of Monte-Carlo Analysis In Estimating Yields Of Acceptable Infrared Detector Array Modules", Proc. SPIE 0430, Infrared Technology IX, (19 January 1984); https://doi.org/10.1117/12.936398

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