26 November 1983 High-Resolution Line-Intensity Measurements Of The V4 + V5 Band Of Acetylene
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A diode-laser spectrometer was used to measure individual R-branch line strengths in the (v4 + v5)° combination band of C2H2. A total band strength of Sv = 63 ±2 cm-1/cm atm was found for the normal isotopic composition of C2H2. Broadening parameters for several R-branch lines were determined with N2 and He as the broadening gases.
© (1983) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Max Loewenstein, Max Loewenstein, James R Podolske, James R Podolske, Prasad Varanasi, Prasad Varanasi, } "High-Resolution Line-Intensity Measurements Of The V4 + V5 Band Of Acetylene", Proc. SPIE 0438, Tunable Diode Laser Development and Spectroscopy Applications, (26 November 1983); doi: 10.1117/12.937461; https://doi.org/10.1117/12.937461


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