28 November 1983 Picosecond Optical Control Of Transferred Electron Devices
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Abstract
Examples of the use of picosecond optical pulses both as diagnostic probes and as triggering signals for transferred electron devices (TEDs) are given. The internal electric field distribution in a planar InP TED was measured with the spatial resolution of the focused beam of pulses. Domain formation in response to a triggering bias pulse is shown to require a minimum pulse duration; the bias dependence of this duration was measured for a gated GaAs TED.
© (1983) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
T. F. Carruthers, "Picosecond Optical Control Of Transferred Electron Devices", Proc. SPIE 0439, Picosecond Optoelectronics, (28 November 1983); doi: 10.1117/12.966070; https://doi.org/10.1117/12.966070
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