28 November 1983 Picosecond Optical Control Of Transferred Electron Devices
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Abstract
Examples of the use of picosecond optical pulses both as diagnostic probes and as triggering signals for transferred electron devices (TEDs) are given. The internal electric field distribution in a planar InP TED was measured with the spatial resolution of the focused beam of pulses. Domain formation in response to a triggering bias pulse is shown to require a minimum pulse duration; the bias dependence of this duration was measured for a gated GaAs TED.
© (1983) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
T. F. Carruthers, T. F. Carruthers, } "Picosecond Optical Control Of Transferred Electron Devices", Proc. SPIE 0439, Picosecond Optoelectronics, (28 November 1983); doi: 10.1117/12.966070; https://doi.org/10.1117/12.966070
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