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28 November 1983 Picosecond Optical Electronic Measurements
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Abstract
We report the development of an electro-optic sampling system and its application to the characterization of high speed GaAs Schottky photodiodes. This system achieves a temporal resolution of 2 ps and shot noise limited sensitivity of 11 μV√Hz.
© (1983) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Brian H. Kolner, David M. Bloom, and Peter S. Cross "Picosecond Optical Electronic Measurements", Proc. SPIE 0439, Picosecond Optoelectronics, (28 November 1983); https://doi.org/10.1117/12.966087
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