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9 January 1984 A Low Noise Infrared Spot Scanner For Testing Detector Arrays
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Abstract
We have built a low noise spot scanner for use in testing the performance of infrared detector arrays for NASA's IR detector technology development program and the University of California's MICRO program. The scanner provides a convenient low noise detector test environment and a wide range of test conditions including versatile temperature control of the detector, ambient background, and blackbody source temperature and control of spot size, color, and brightness.
© (1984) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
R C Puetter, P Brissenden, J Casler, R G Hier, and B Jones "A Low Noise Infrared Spot Scanner For Testing Detector Arrays", Proc. SPIE 0445, Instrumentation in Astronomy V, (9 January 1984); https://doi.org/10.1117/12.966143
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