Paper
27 March 1984 Angle-Resolved Photoemission Extended Fine Structure
J J Barton, C C Bahr, Z Hussain, S W Robey, L E Klebanoff, D A Shirley
Author Affiliations +
Proceedings Volume 0447, Science with Soft X-Rays; (1984) https://doi.org/10.1117/12.939184
Event: 1983 Brookhaven Conference: Science with Soft X-Rays, 1983, Upton, United States
Abstract
Core level angle-resolved photoemission intensity oscillates sinusoidally with increasing photoelectron momentum. Interference between direct and scattered photo-emission causes this angle-resolved photoemission extended fine structure (ARPEFS). We will discuss an analytic single-scattering theory which quantitatively describes the oscillations. The procedures for extracting surface geometry information from photo-emission measurements will be illustrated with S(1s) ARPEFS from S on Ni(100) and Cu(100) obtained with the soft X-ray double crystal monochromator at the Stanford Synchrotron Radiation Laboratory. Building on the surface sensitivity and chemical selectivity of photoemission, ARPEFS analysis provides direct geometrical information from the oscillation frequencies (derived with auto-regressive Fourier analysis), from intensity changes with polarization and analyzer position, and from analysis of scattering phase-shift zero-crossings.
© (1984) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
J J Barton, C C Bahr, Z Hussain, S W Robey, L E Klebanoff, and D A Shirley "Angle-Resolved Photoemission Extended Fine Structure", Proc. SPIE 0447, Science with Soft X-Rays, (27 March 1984); https://doi.org/10.1117/12.939184
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KEYWORDS
Scattering

Chemical species

Chemical analysis

Polarization

Fourier transforms

Sensors

Diffraction

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