In Situ Characterization And Non Solar Applications Of Semiconductor Liquid Junctions

Micha Tomkiewicz

doi:10.1117/12.939296

10 May 1984 In Situ Characterization And Non Solar Applications Of Semiconductor Liquid Junctions

Micha Tomkiewicz

Proceedings Volume 0452, Spectroscopic Characterization Techniques for Semiconductor Technology I; (1984) https://doi.org/10.1117/12.939296
Event: 1983 Cambridge Symposium, 1983, Cambridge, United States

Abstract

In the first part of this paper we describe some non-solar possible applications of semiconductor -liquid junction methodologies. These include: etching, photoetching, growth of a passivation layer, detection of metallic corrosion, electrochromic display devices, photodeposition of metals on semi-conductors and insitu characterization of semiconductor bulk properties. In the second part, we describe some of the methodologies used to characterize the semiconductor-liquid junctions. These include methods that were borrowed from electrochemistry and solid state photovoltaic devices, in addition to more specific methods based on electric field modulation of system's response such as impedance, electroreflectance and modulated photoluminescence.

Citation Download Citation

Micha Tomkiewicz "In Situ Characterization And Non Solar Applications Of Semiconductor Liquid Junctions", Proc. SPIE 0452, Spectroscopic Characterization Techniques for Semiconductor Technology I, (10 May 1984); https://doi.org/10.1117/12.939296

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