An ESPI Contouring Technique In Strain Analysis

Svein Winther; Gudmunn A. Slettemoen

doi:10.1117/12.942383

18 January 1985 An ESPI Contouring Technique In Strain Analysis

Svein Winther, Gudmunn A. Slettemoen

Proceedings Volume 0473, Symposium Optika '84; (1985) https://doi.org/10.1117/12.942383
Event: Symposium Optika '84, 1984, Budapest, Hungary

Abstract

A new electronic speckle pattern interferometric (ESPI) contouring technique, which is a variation of the holographic two beam illumination method, is described. Together with necessary mathematical derivations, experimental test results are reported. The system is an integrated part of a deformation measuring system where contour data will be used in strain analysis.

Citation Download Citation

Svein Winther and Gudmunn A. Slettemoen "An ESPI Contouring Technique In Strain Analysis", Proc. SPIE 0473, Symposium Optika '84, (18 January 1985); https://doi.org/10.1117/12.942383

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