18 January 1985 An ESPI Contouring Technique In Strain Analysis
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Proceedings Volume 0473, Symposium Optika '84; (1985) https://doi.org/10.1117/12.942383
Event: Symposium Optika '84, 1984, Budapest, Hungary
A new electronic speckle pattern interferometric (ESPI) contouring technique, which is a variation of the holographic two beam illumination method, is described. Together with necessary mathematical derivations, experimental test results are reported. The system is an integrated part of a deformation measuring system where contour data will be used in strain analysis.
© (1985) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Svein Winther, Gudmunn A. Slettemoen, "An ESPI Contouring Technique In Strain Analysis", Proc. SPIE 0473, Symposium Optika '84, (18 January 1985); doi: 10.1117/12.942383; https://doi.org/10.1117/12.942383

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