18 January 1985 An ESPI Contouring Technique In Strain Analysis
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Proceedings Volume 0473, Symposium Optika '84; (1985) https://doi.org/10.1117/12.942383
Event: Symposium Optika '84, 1984, Budapest, Hungary
Abstract
A new electronic speckle pattern interferometric (ESPI) contouring technique, which is a variation of the holographic two beam illumination method, is described. Together with necessary mathematical derivations, experimental test results are reported. The system is an integrated part of a deformation measuring system where contour data will be used in strain analysis.
© (1985) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Svein Winther, Svein Winther, Gudmunn A. Slettemoen, Gudmunn A. Slettemoen, } "An ESPI Contouring Technique In Strain Analysis", Proc. SPIE 0473, Symposium Optika '84, (18 January 1985); doi: 10.1117/12.942383; https://doi.org/10.1117/12.942383
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