Application Of Ionization-Type Semiconductor Device For Infra-Red Diagnostics

Yu. A. Astrov; Yu. A. Drozhbin; L. N. Portsel; V. E. Prokopenko; V. B. Semenov; Yu. P. Tusova

doi:10.1117/12.967992

1 February 1985 Application Of Ionization-Type Semiconductor Device For Infra-Red Diagnostics

Yu. A. Astrov, Yu. A. Drozhbin, L. N. Portsel, V. E. Prokopenko, V. B. Semenov, Yu. P. Tusova

Proceedings Volume 0491, 16th Intl Congress on High Speed Photography and Photonics; (1985) https://doi.org/10.1117/12.967992
Event: 16th International Congress on High Speed Photography and Photonics, 1984, Strasbourg, France

Abstract

The problem of recording fast processes in IR spectrum remains an urgent one up till now. The authors of /1-3/ proposed a principally new device which they called ionization-type semiconductor system (ITSS). It features high sensitivity and rapid response in a broad spectral range. The ITSS is a promising means for recording and measuring the space-time parameters of IR flash sources.

Citation Download Citation

Yu. A. Astrov, Yu. A. Drozhbin, L. N. Portsel, V. E. Prokopenko, V. B. Semenov, and Yu. P. Tusova "Application Of Ionization-Type Semiconductor Device For Infra-Red Diagnostics", Proc. SPIE 0491, 16th Intl Congress on High Speed Photography and Photonics, (1 February 1985); https://doi.org/10.1117/12.967992

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available