1 February 1985 Application Of Ionization-Type Semiconductor Device For Infra-Red Diagnostics
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Proceedings Volume 0491, 16th Intl Congress on High Speed Photography and Photonics; (1985) https://doi.org/10.1117/12.967992
Event: 16th International Congress on High Speed Photography and Photonics, 1984, Strasbourg, France
Abstract
The problem of recording fast processes in IR spectrum remains an urgent one up till now. The authors of /1-3/ proposed a principally new device which they called ionization-type semiconductor system (ITSS). It features high sensitivity and rapid response in a broad spectral range. The ITSS is a promising means for recording and measuring the space-time parameters of IR flash sources.
© (1985) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Yu. A. Astrov, Yu. A. Drozhbin, L. N. Portsel, V. E. Prokopenko, V. B. Semenov, Yu. P. Tusova, "Application Of Ionization-Type Semiconductor Device For Infra-Red Diagnostics", Proc. SPIE 0491, 16th Intl Congress on High Speed Photography and Photonics, (1 February 1985); doi: 10.1117/12.967992; https://doi.org/10.1117/12.967992
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