27 March 1985 Roughness Of Films And Surfaces Studied By Optical Lateral Waves
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Proceedings Volume 0492, 1984 European Conf on Optics, Optical Systems, and Applications; (1985); doi: 10.1117/12.943700
Event: 1984 European Conference on Optics, Optical Systems and Applications, 1984, Amsterdam, Netherlands
Abstract
A lateral wave appears at an interface between two media when a bounded beam is incident in the denser medium at the critical angle. The evanescent penetration into the less dense medium offers a method of exploring the interface region and has been used to study weak absorption. In this paper, results relating to the effects of surface roughness and deposited film inhomogeneities are discussed.
© (1985) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Oliver S. Heavens, "Roughness Of Films And Surfaces Studied By Optical Lateral Waves", Proc. SPIE 0492, 1984 European Conf on Optics, Optical Systems, and Applications, (27 March 1985); doi: 10.1117/12.943700; https://doi.org/10.1117/12.943700
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KEYWORDS
Scattering

Light scattering

Interfaces

Laser scattering

Transmittance

Absorption

Integrating spheres

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