8 February 1985 Beam And Spot Profile Measurement Methods For Optical Storage Systems
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Abstract
Convenient measurements of the spatial dimensions of propagating laser beams and submicron focused spots are described, applicable to optical storage systems. Methods for determining accuracy are discussed, together with error analyses. Examples of typical beam and focused spot measurements are presented including Gaussian, non-Gaussian and aberrated spots.
© (1985) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Scott D. Wilson, Scott D. Wilson, Timothy Reed, Timothy Reed, } "Beam And Spot Profile Measurement Methods For Optical Storage Systems", Proc. SPIE 0499, Optical Radiation Measurements, (8 February 1985); doi: 10.1117/12.971075; https://doi.org/10.1117/12.971075
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