Linear Systems Approach To Fiber Characterization Using Beam Profile Measurements

Michael K. Giles; Ernest M. Kim

doi:10.1117/12.944581

26 December 1984 Linear Systems Approach To Fiber Characterization Using Beam Profile Measurements

Michael K. Giles, Ernest M. Kim

Proceedings Volume 0500, Fiber Optics: Short-Haul and Long-Haul Measurements and Applications II; (1984) https://doi.org/10.1117/12.944581
Event: 28th Annual Technical Symposium, 1984, San Diego, United States

Abstract

The index profile and core diameter of an optical fiber are often obtained by measuring the irradiance distribution at the output of the fiber. In general, a photodiode with a pinhole aperture is used to scan across the irradiance distribution and thus measure the beam profile. Using linear systems theory, we characterize this measurement process as a convolution operation and present the mathematical formalism used to estimate the achievable measurement accuracy. Experimental data are presented which confirm the theoretical results. As an outgrowth of the linear systems analysis, we suggest the use of a scanning slit rather than a pinhole to measure irradiance distributions. We show that the scanning slit is not only easier to implement than the scanning pinhole since it allows more light to be collected, but it also provides accurate beam profile data. Data collected using both techniques (pinhole and slit scanning) are presented and compared for representative beams.

Citation Download Citation

Michael K. Giles and Ernest M. Kim "Linear Systems Approach To Fiber Characterization Using Beam Profile Measurements", Proc. SPIE 0500, Fiber Optics: Short-Haul and Long-Haul Measurements and Applications II, (26 December 1984); https://doi.org/10.1117/12.944581

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