21 January 1985 Devices For Measuring MTFs In The Infrared
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Abstract
MTFs are usually computed indirectly from spread functions. The patterns used to generate these functions lead to certain problems in infrared systems. Square wave patterns have some advantages but also have some disadvantages. Sine wave patterns are useful but generally must be produced as area patterns. Various ways of using sinusoidal patterns are described.
© (1985) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Kenneth Pulliam, Stephen McHugh, "Devices For Measuring MTFs In The Infrared", Proc. SPIE 0510, Infrared Technology X, (21 January 1985); doi: 10.1117/12.944999; https://doi.org/10.1117/12.944999
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