Inflight Resolution Evaluation For Thermal Imaging Systems

Steven E. Shimer

doi:10.1117/12.945004

21 January 1985 Inflight Resolution Evaluation For Thermal Imaging Systems

Steven E. Shimer

Proceedings Volume 0510, Infrared Technology X; (1985) https://doi.org/10.1117/12.945004
Event: 28th Annual Technical Symposium, 1984, San Diego, United States

Abstract

This paper presents a method to determine the resolution of an airborne Thermal Imaging System (TIS) under the conditions and in the environment of typical operation. By determining the resolution of the entire system (e.g. sensor, aircraft, display, pilot) a more realistic measure of the systems true resolution can be determined. The effects of Atmospheric Transmission and Target Radiation are also included in the evaluation.

Citation Download Citation

Steven E. Shimer "Inflight Resolution Evaluation For Thermal Imaging Systems", Proc. SPIE 0510, Infrared Technology X, (21 January 1985); https://doi.org/10.1117/12.945004

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