Statistical Effects In The Measurement And Characterization Of Smooth Scattering Surfaces

E. L. Church

doi:10.1117/12.945030

17 January 1985 Statistical Effects In The Measurement And Characterization Of Smooth Scattering Surfaces

E. L. Church

Proceedings Volume 0511, Stray Radiation IV; (1985) https://doi.org/10.1117/12.945030
Event: 28th Annual Technical Symposium, 1984, San Diego, United States

Abstract

Nature obliges us to use a statistical description of the scattering of light from randomly-rough surfaces. This paper discusses the role of statistical models and fluctuation phenomena in the measurement and characterization of such surfaces using area and profiling techniques.

Citation Download Citation

E. L. Church "Statistical Effects In The Measurement And Characterization Of Smooth Scattering Surfaces", Proc. SPIE 0511, Stray Radiation IV, (17 January 1985); https://doi.org/10.1117/12.945030

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