Paper
20 March 1985 Thermographic Studies Of Catalytic Reactions
Geoffrey A. D'Netto, Peter C. Pawlicki, Roger A. Schmitz
Author Affiliations +
Abstract
Infrared thermography has been used to study spatial temperature distributions on heterogeneous catalytic surfaces under ordinary reaction conditions. Thermograms of supported catalyst wafers, gauzes, and foils, obtained under steady-state and oscillatory conditions, showed the presence of marked thermal variations on the surface of the catalysts. In the case of supported catalysts, large temperature variations were observed under steady-state conditions, and thermograms show that hot spots with high activity seem to dominate the process. In such a case, conventional calculations of specific reaction rate and turnover numbers with the implicit assumption of spatial uniformity would be in error. Thermographic observation has shown that spatial variations of the rate of reaction on catalytic surfaces seem to be greater than was previously suspected, and the implications, both practical and theoretical, may be far reaching. This work was the first to use thermal imaging techniques in the study of spatial phenomena on catalytic surfaces under steady-state and dynamic conditions. The technique yields valuable information and is potentially a useful and inexpensive addition to the array of tools available to researchers for the understanding of catalytic processes. Thermography may be useful in the testing and screening of catalysts, and appears to be the only generally useful method for obtaining spatial information on catalytic surfaces under ordinary reaction conditions.
© (1985) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Geoffrey A. D'Netto, Peter C. Pawlicki, and Roger A. Schmitz "Thermographic Studies Of Catalytic Reactions", Proc. SPIE 0520, Thermosense VII: Thermal Infrared Sensing for Diagnostics and Control, (20 March 1985); https://doi.org/10.1117/12.946135
Lens.org Logo
CITATIONS
Cited by 4 scholarly publications.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Thermography

Infrared radiation

Semiconducting wafers

Temperature metrology

Imaging systems

Hydrogen

Infrared imaging

Back to Top