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3 September 1985 ASTM And OSA Efforts To Develop An Optical Surface Roughness Measurement Standard
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Proceedings Volume 0525, Measurement and Effects of Surface Defects & Quality of Polish; (1985) https://doi.org/10.1117/12.946345
Event: 1985 Los Angeles Technical Symposium, 1985, Los Angeles, United States
Abstract
The development of a formal standard test method for the surface microroughness characterization of optical components is outlined. The results of an interlaboratory comparison of the test method are presented to illustrate the advantages and limitations of this approach to measure effective rms surface roughness. The lab-to-lab variations in measured total integrated scatter (TIS), effective roughness, were found to be about +15%. The within-lab variations were about ±5%.
© (1985) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
John A. Detrio "ASTM And OSA Efforts To Develop An Optical Surface Roughness Measurement Standard", Proc. SPIE 0525, Measurement and Effects of Surface Defects & Quality of Polish, (3 September 1985); https://doi.org/10.1117/12.946345
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