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2 April 1985 On-Chip, Picosecond, Electrical-Characterization Measurements For Si Integrated Circuits
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Proceedings Volume 0533, Ultrashort Pulse Spectroscopy and Applications; (1985) https://doi.org/10.1117/12.946552
Event: 1985 Los Angeles Technical Symposium, 1985, Los Angeles, United States
Abstract
We have developed integrated photoconductors for picosecond pulse generation and sampling on Si integrated circuits. Here we describe the device implementation.
© (1985) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
R. B. Hammond, N. G. Paulter, R. S. Wagner, W. R. Eisenstadt, R. W. Dutton, and D. R. Bowman "On-Chip, Picosecond, Electrical-Characterization Measurements For Si Integrated Circuits", Proc. SPIE 0533, Ultrashort Pulse Spectroscopy and Applications, (2 April 1985); https://doi.org/10.1117/12.946552
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