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20 November 1985 Laser Measurement Techniques - Laser Spectroscopy In Semiconductors
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Proceedings Volume 0540, Southwest Conf on Optics '85; (1985)
Event: 1985 Albuquerque Conferences on Optics, 1985, Albuquerque, United States
A CAMAC-based digital data acquisition system to study luminescence spectra and dynamics in semiconductors using pulsed and cw laser sources is described. Various experimental techniques for measuring time-dependent luminescence and laser excitation spectra are discussed. In order to demonstrate the system performance and sensitivity of this data acquisition system, experimental low-temperature laser-induced luminescence data for the oxygen-bound exciton in the II-VI semiconductor compound ZnTe is presented.
© (1985) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
E. D. Jones and G. L. Wickstrom "Laser Measurement Techniques - Laser Spectroscopy In Semiconductors", Proc. SPIE 0540, Southwest Conf on Optics '85, (20 November 1985);

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