20 November 1985 Simple, High Sensitivity Pencil Beam Light Heterodyne Interferometer
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Proceedings Volume 0540, Southwest Conf on Optics '85; (1985) https://doi.org/10.1117/12.976157
Event: 1985 Albuquerque Conferences on Optics, 1985, Albuquerque, United States
Abstract
A model of the new heterodyne interferometer for testing of transparent objects, capable of providing diagrams of the optical path difference with sensitivity better than A/100 and with spatial resolutions better than 50 lines per millimeter for 50 mm diameter samples, is presented. Influences of various factors on the measurement accuracy are discussed. The results of the experiments involved prove that the instrument may be used in the following: analyses of optical specimens; analyses of the profiles of the refractive index of optical fibers; measurement of thickness of film layers; analyses of alterations of factor of refractive index of liquids. The significant advantages are as follows high sensitivity; high resistance against external factors; simplicity of the mechanicooptical system.
© (1985) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Pawel Drabarek, "Simple, High Sensitivity Pencil Beam Light Heterodyne Interferometer", Proc. SPIE 0540, Southwest Conf on Optics '85, (20 November 1985); doi: 10.1117/12.976157; https://doi.org/10.1117/12.976157
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