A Systematic Study Of The Effect Of Hooking Upon Contact On The Performance Of Electrolytically Etched Point Contact MOM Diodes

C. Yu; M. A. Hemmatian; A. Niczad; Y. Taghipoor; A. Yekrangian

doi:10.1117/12.948254

24 October 1985 A Systematic Study Of The Effect Of Hooking Upon Contact On The Performance Of Electrolytically Etched Point Contact MOM Diodes

C. Yu, M. A. Hemmatian, A. Niczad, Y. Taghipoor, A. Yekrangian

Author Affiliations +

Proceedings Volume 0544, Millimeter Wave Technology III; (1985) https://doi.org/10.1117/12.948254
Event: 1985 Technical Symposium East, 1985, Arlington, United States

Abstract

To resolve the controversy regarding hooking of the whisker tip without damage as a reliable method for stabilizing the MOM point contact diode without significant degradation of diode performance, a systematic study is implemented to control the fabrication of such tips, the contacting process and monitoring of diode performance in the microwave and mm wave region. The fabrication and contacting processes are monitored by microscopes, and the tip with and without hooking is scrutinized with the SEM. Results so far have indicated the reproducibility of the etching process, and the tolerance range of tip dimensions that will make contacting process and surface less critical. Improvement in stability is also significant with controlled hooking of the tip with no noticeable loss of diode sensitivity. The stability is long term and is quite immune to moderate vibrations and laser heating. Diode performance is monitored at 10 and 50 GHz in direct detection and mixing both before and after hooking.

Citation Download Citation

C. Yu, M. A. Hemmatian, A. Niczad, Y. Taghipoor, and A. Yekrangian "A Systematic Study Of The Effect Of Hooking Upon Contact On The Performance Of Electrolytically Etched Point Contact MOM Diodes", Proc. SPIE 0544, Millimeter Wave Technology III, (24 October 1985); https://doi.org/10.1117/12.948254

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