Millimeter-Visible Injection Locking and Testing

Harold Fetterman; Chewlan Liew; Wai-Leung Ngai

doi:10.1117/12.948339

28 October 1985 Millimeter-Visible Injection Locking and Testing

Harold Fetterman, Chewlan Liew, Wai-Leung Ngai

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Proceedings Volume 0545, Optical Technology for Microwave Applications II; (1985) https://doi.org/10.1117/12.948339
Event: 1985 Technical Symposium East, 1985, Arlington, United States

Abstract

A Visible-Millimeter Wave mixing system for testing high frequency devices has been set up with all components operating satisfactorily and locked to stabilized cavities. Using this system, mixing has been obtained, with frequency separations ranging to 100 GHz, in a number of GaAs and GaAs/AlGaAs devices. These devices include commercial FETs, state of the art industrial FETs as well as modulation doped HEMT structures and Heterojunction bi-polar transistors.

Citation Download Citation

Harold Fetterman, Harold Fetterman, Chewlan Liew, Chewlan Liew, Wai-Leung Ngai, Wai-Leung Ngai, "Millimeter-Visible Injection Locking and Testing", Proc. SPIE 0545, Optical Technology for Microwave Applications II, (28 October 1985); doi: 10.1117/12.948339; https://doi.org/10.1117/12.948339

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