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28 October 1985 Cryogenic Production Testing
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Proceedings Volume 0550, Sensor Design Using Computer Tools II; (1985) https://doi.org/10.1117/12.948858
Event: 1985 Technical Symposium East, 1985, Arlington, United States
Abstract
Rockwell has realized rapid testing of Infrared Focal Plane Arrays (IRFPAs) using a totally automated cryogenic test station with the latest technology in device handling, data acquisition, illumination and throughput capabilities. This station provides testing of HgCdTe Focal Plane Arrays fabricated in a fully certified production facility. All aspects of this facility are under Quality Control surveillance including the hardware and software used by the automated test station.
© (1985) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
R. K. Buchness, E. Banks, J. Doidge, A. Gable, L. Nelson, and D. Olsen "Cryogenic Production Testing", Proc. SPIE 0550, Sensor Design Using Computer Tools II, (28 October 1985); https://doi.org/10.1117/12.948858
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