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28 October 1985 Focal Plane Products Database SPIE Technical Symposium East 1985
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Proceedings Volume 0550, Sensor Design Using Computer Tools II; (1985)
Event: 1985 Technical Symposium East, 1985, Arlington, United States
Rockwell International Corporation has established an automated database system for the storage, retrieval and analysis of focal plane manufacturing information. In 1983, Rockwell implemented the first fully certified Mercury Cadmium Telluride (HgCdTe) production facility in the United States. As part of the development of this facility, key processing variables were identified for inclusion in a comprehensive data base. Our database system contains information from boule, slice, wafer and die sources. The current database consists of data from over one million on-line measurments drawn from the entire range of our production and test facilities. Database analysis routines provide various tabular, plot and statistical output that are used toward the goals of lowering cost and improving yield in the process of HgCdTe manufacturing.
© (1985) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
R. K. Buchness, L. A. Mathine, and Y. Juravel "Focal Plane Products Database SPIE Technical Symposium East 1985", Proc. SPIE 0550, Sensor Design Using Computer Tools II, (28 October 1985);

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