20 December 1985 ADC Errors In Quantitative FT-IR Spectroscopy
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Proceedings Volume 0553, Fourier and Computerized Infrared Spectroscopy; (1985) https://doi.org/10.1117/12.970774
Event: 1985 International Conference on Fourier and Computerized Infrared Spectroscopy, 1985, Ottawa, Canada
Analog-to-digital converters (ADCs) are an indispensible component in the electronic processing chain of modern computer-ized instruments, such as Fourier transform infrared (FT-IR) spectrophotometers. In an FT-IR spectrometer, the interferogram of a broadband source covers a wide dynamic range, on the order of 106:1. This is a very demanding application for a high-speed ADC. Since FT-IR spectroscopy carries the promise of achieving high accuracy, all possible sources of systematic errors must be examined in order to validate that promise'. We will show that linearity errors in the ADC can result in a distortion of the transformed spectrum. This distortion can lead to significant systematic inaccuracies in FT-IR spectrophotometry.
© (1985) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Aslan Baghdadi, Warren K. Gladden, "ADC Errors In Quantitative FT-IR Spectroscopy", Proc. SPIE 0553, Fourier and Computerized Infrared Spectroscopy, (20 December 1985); doi: 10.1117/12.970774; https://doi.org/10.1117/12.970774

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