20 December 1985 Characterization of Thin Films on Glassy Carbon Electrodes by Infrared External Reflection Spectroscopy
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Proceedings Volume 0553, Fourier and Computerized Infrared Spectroscopy; (1985) https://doi.org/10.1117/12.970930
Event: 1985 International Conference on Fourier and Computerized Infrared Spectroscopy, 1985, Ottawa, Canada
Abstract
The utility of infrared external reflection spectroscopy [IR-ERS] for the characterization of thin organic surface structures on nonmetallic substrates, such as glassy carbon [GC], has been examined. Surface sensitivity as a function of the angle of incidence and polarization was determined by calculations of mean-square electric field values [MSEF1. Band shapes for IR-ERS spectra, obtained at optimum conditions for thin films (80-3500 A) of poly(methyl metharcylate) [PMMA] on GC, were severly distorted compared to those obtained with transmission spectroscopy. The IR-ERS spectra were accurately modeled (±1096) by classical electromagnetic theory, indicating that the distortions resulted from the inherent physical differences between ERS and transmission measurements.. These results also demonstrated the feasibility of performing quantitative IR-ERS at nonmetallic substrates.
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Marc D. Porter, Marc D. Porter, David L. Allara, David L. Allara, Thomas B. Bright, Thomas B. Bright, Theodore Kuwana, Theodore Kuwana, } "Characterization of Thin Films on Glassy Carbon Electrodes by Infrared External Reflection Spectroscopy", Proc. SPIE 0553, Fourier and Computerized Infrared Spectroscopy, (20 December 1985); doi: 10.1117/12.970930; https://doi.org/10.1117/12.970930
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