20 December 1985 Dynamic approach to FT-IR spectroelectrochemistry
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Proceedings Volume 0553, Fourier and Computerized Infrared Spectroscopy; (1985) https://doi.org/10.1117/12.970770
Event: 1985 International Conference on Fourier and Computerized Infrared Spectroscopy, 1985, Ottawa, Canada
Rapid-scan time-resolved Fourier-transform infrared (FT-IR) spectroscopy is a method that allows one to examine the changes in the infrared spectrum of a system undergoing a chemical or physical change. This method exploits the inherent multiplex advantage of FT-IR; each scan of the FT-IR spectrometer yields the entire infrared spectrum of the sample at the time the scan is taken. Clearly, a time-resoved infrared spectrum can be obtained by storing each scan in a separate computer file. The degree of time resolution is limited by the speed at which the interferometer mirror can be moved and the data system can acquire and store spectral data. At medium spectral resolution (16 cm-1), time resolutions of 12-15 milliseconds are possible using commercially available instrumentation and software, that is, interferograms may be collected and stored at a rate of 65-85 scans per second (1).
© (1985) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Stuart I. Yaniger, Stuart I. Yaniger, Warren Vidrine, Warren Vidrine, } "Dynamic approach to FT-IR spectroelectrochemistry", Proc. SPIE 0553, Fourier and Computerized Infrared Spectroscopy, (20 December 1985); doi: 10.1117/12.970770; https://doi.org/10.1117/12.970770

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