Experimental and theoretical characterization of surfaces using infrared reflectance spectroscopy

David K. Ottesen; Lawrence R. Thorne; Robert W. Bradshaw

doi:10.1117/12.970929

20 December 1985 Experimental and theoretical characterization of surfaces using infrared reflectance spectroscopy

David K. Ottesen, Lawrence R. Thorne, Robert W. Bradshaw

Proceedings Volume 0553, Fourier and Computerized Infrared Spectroscopy; (1985) https://doi.org/10.1117/12.970929
Event: 1985 International Conference on Fourier and Computerized Infrared Spectroscopy, 1985, Ottawa, Canada

Abstract

External reflectance infrared spectroscopy has been used to study the formation of thin oxide films on metals. Experimental data have been acquired with a Fourier transform infrared (FT-IR) spectrometer using a polarized beam at high angles of incidence, and have been compared with theoretical calculations.

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David K. Ottesen, Lawrence R. Thorne, and Robert W. Bradshaw "Experimental and theoretical characterization of surfaces using infrared reflectance spectroscopy", Proc. SPIE 0553, Fourier and Computerized Infrared Spectroscopy, (20 December 1985); https://doi.org/10.1117/12.970929

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