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20 December 1985 FT-IR : Today And Tomorrow
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Proceedings Volume 0553, Fourier and Computerized Infrared Spectroscopy; (1985)
Event: 1985 International Conference on Fourier and Computerized Infrared Spectroscopy, 1985, Ottawa, Canada
The last decade has been a period of astonishing growth and vigor for FT-IR spectroscopy. The first International Conference on Fourier Transform Spectroscopy held in Aspen, Colorado, in 1970, described new instrumentation using Michelson interferometers that had been developed in response to problems in astro-physics, where faster acquisition of data and better ways of handling the large quantity of data generated were needed. The problems had driven the development of new instrumentation. With this impetus, instrument manufacturers introduced reliable, computerized FT-IR instruments for use by industry. These new instru-ments, with their speed and advanced data processing capabilities, led to an explosion of new examples of practical problem solving, as well as new sophistication in analyzing structures of materials or composition mixtures. Today the field of industrial infrared spectroscopy which was literally "transformed" just 15 years ago is vigorous, healthy, and still expanding. Perhaps we have now come full circle, for today industry is again articulating ever more challenging problems that need solving via novel instrumentation and/or accessories. This will lead to a tomorrow in areas that have been elegantly described in the invited lectures and poster contributions of this conference. In this paper, we will describe some typical uses of FT-IR today and from them predict where FT-IR will "walk tomorrow". We will concentrate on industrial applications because that is the community we represent. It is also relevant to point out that the growth and success of new analytical tools or techniques are dependent on the extent of use by industry. Industrial practical problem solving - and just because it's practical or solving a problem does not preclude good science and basic work - drives the development of newer and better ways to get answers to problems or to understand properties of materials.
© (1985) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
J. G. Grasselli, M. Mehicic, and J. R. Mooney "FT-IR : Today And Tomorrow", Proc. SPIE 0553, Fourier and Computerized Infrared Spectroscopy, (20 December 1985);

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