20 December 1985 Fourier Transform Infrared Ellipsometry Of Thin Polymer Films
Author Affiliations +
Proceedings Volume 0553, Fourier and Computerized Infrared Spectroscopy; (1985) https://doi.org/10.1117/12.970736
Event: 1985 International Conference on Fourier and Computerized Infrared Spectroscopy, 1985, Ottawa, Canada
Abstract
Reflection spectra containing phase as well as intensity information were collected on a FT-IR spectrometer using two linear polarizers. The sample consisted of a poly(vinyl acetate) (PVAc) film on a copper substrate. Using well known principles of ellipsometry, the relative phase retardation (delta) and relative amplitude (psi) were calculated from these measurements.
© (1985) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
R . T. Graf, R . T. Graf, J. L. Koenig, J. L. Koenig, H. Ishida, H. Ishida, "Fourier Transform Infrared Ellipsometry Of Thin Polymer Films", Proc. SPIE 0553, Fourier and Computerized Infrared Spectroscopy, (20 December 1985); doi: 10.1117/12.970736; https://doi.org/10.1117/12.970736
PROCEEDINGS
2 PAGES


SHARE
Back to Top