20 December 1985 IR and Far IR Characterization of High Surface Materials and Adsorbed Species
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Proceedings Volume 0553, Fourier and Computerized Infrared Spectroscopy; (1985) https://doi.org/10.1117/12.970927
Event: 1985 International Conference on Fourier and Computerized Infrared Spectroscopy, 1985, Ottawa, Canada
Abstract
This paper reports recent progress made in FTIR investigation of high surface materials such as SiO2 by means of the transmission technique. FTIR spectroscopy provides the following advantages: (a) Improved resolution makes the correct detection of band shapes of absorptions possible which are assigned to free surface OH groups. (b) Part of the finger print region and the total of the far IR range are now accessible. (c) Difference spectra allow the detec-tion of minute changes in the surface induced by variation of physical or chemical parameters.
© (1985) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
P. Hoffman, E. Knozinger, "IR and Far IR Characterization of High Surface Materials and Adsorbed Species", Proc. SPIE 0553, Fourier and Computerized Infrared Spectroscopy, (20 December 1985); doi: 10.1117/12.970927; https://doi.org/10.1117/12.970927
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