Infrared Emission Spectroscopy: A New Accessory

M. Handke; N. J. Harrick; J. L. Lauer; P. Vogel

doi:10.1117/12.970839

20 December 1985 Infrared Emission Spectroscopy: A New Accessory

M. Handke, N. J. Harrick, J. L. Lauer, P. Vogel

Proceedings Volume 0553, Fourier and Computerized Infrared Spectroscopy; (1985) https://doi.org/10.1117/12.970839
Event: 1985 International Conference on Fourier and Computerized Infrared Spectroscopy, 1985, Ottawa, Canada

Abstract

The principal problem in measurement of emission IR spectra is the low signal to noise ratio resulting from the large background radiation. One method of increasing the signal is to collect the emitted radiation over a very large solid angle using an ellipsoidal mirror. In this method, placing the sample at the short focal length of the ellipsoid both increases the amount of radiation collected for an improved signal to noise ratio as well as facilitates sampling of small areas. For locating the area of interest, a microscope is mounted on the emission accessory.

Citation Download Citation

M. Handke, N. J. Harrick, J. L. Lauer, and P. Vogel "Infrared Emission Spectroscopy: A New Accessory", Proc. SPIE 0553, Fourier and Computerized Infrared Spectroscopy, (20 December 1985); https://doi.org/10.1117/12.970839

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