20 December 1985 Microsample Analysis Using An Infrared Microscope
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Proceedings Volume 0553, Fourier and Computerized Infrared Spectroscopy; (1985) https://doi.org/10.1117/12.970784
Event: 1985 International Conference on Fourier and Computerized Infrared Spectroscopy, 1985, Ottawa, Canada
A microscope that can measure both in transmittance and reflectance with high sensitivity is described. Furthermore, the changeover is accomplished by moving only two handles and no realignment of the optics is necessary. Advantages of using this "dual-mode" microscope is discussed and several results are reported, highlighting some of its areas of application.
© (1985) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
T. D. Dee, T. D. Dee, W. Herres, W. Herres, A . Simon, A . Simon, G . Zachman, G . Zachman, } "Microsample Analysis Using An Infrared Microscope", Proc. SPIE 0553, Fourier and Computerized Infrared Spectroscopy, (20 December 1985); doi: 10.1117/12.970784; https://doi.org/10.1117/12.970784

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