20 December 1985 Surface Electromagnetic Wave Fourier-Transform Infrared (FTIR) sPectroscopy Of Very Thin Films
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Proceedings Volume 0553, Fourier and Computerized Infrared Spectroscopy; (1985) https://doi.org/10.1117/12.970913
Event: 1985 International Conference on Fourier and Computerized Infrared Spectroscopy, 1985, Ottawa, Canada
Abstract
Surface electromagnetic wave (SEW) spectroscopy is a new high sensitive technique of the surface analysis, that recently was used only in the narrow spectral interval contai-ning tunable CO2 laser lines.1 Use of thermal sources of infrared (IR) radiation to excite SEW is difficult because of the small coupling efficiency. For effective excitation it is necessary to have an extremely collimated beam that is easy to obtain with laser sources, but is difficult with an extended thermal source. To detect the very weak SEW in the later case, instruments of extremely high sensitivity are necessary. We used the IR Four4r-transform spectrometer FTS-20B (Digilab) equipped with HgCdTe cooling detector e,3 . Two-mirrors SEW unit containing the sample (see Fig.1) is placed into the sample compartement of the instrument. Grating SEW coupling is used. Two gratings (dimensions 10x5 mm2) were etched on the glass plate with 10 mm separation. Then, the plate was coated by the metal (copper). SEW excitation condition for light incidence =glee and wavevector kx is k 27r1) sine + 271 E a
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G. N. Zhizhin, G. N. Zhizhin, M. A. Moskalova, M. A. Moskalova, V. A. Sychugov, V. A. Sychugov, V. A. Yakovlev, V. A. Yakovlev, } "Surface Electromagnetic Wave Fourier-Transform Infrared (FTIR) sPectroscopy Of Very Thin Films", Proc. SPIE 0553, Fourier and Computerized Infrared Spectroscopy, (20 December 1985); doi: 10.1117/12.970913; https://doi.org/10.1117/12.970913
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