20 December 1985 Triple Modulation FT-IR Spectrometry for Surface Analysis in the Far Infrared Region
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Proceedings Volume 0553, Fourier and Computerized Infrared Spectroscopy; (1985) https://doi.org/10.1117/12.970829
Event: 1985 International Conference on Fourier and Computerized Infrared Spectroscopy, 1985, Ottawa, Canada
Abstract
Although several spectroscopic techniques yield analytical information about species adsorbed on flat surfaces, most of the more sensitive measurements require the sample to be placed in a high vacuum and/or only yield the elemental composition of the surface. Infrared spectrometry is not limited by either of the above constraints but does have the disadvantage of relatively poor sensitivity. Most previous measurements of the infrared spectra of adsorbed species on flat substrates have been above 700 cm-1 so that only the intramolecular vibrations of the adsorbate can be observed. Of equal importance, but very infrequently studied, are the intermolecular vibrational modes of the sorbed species and the metal substrate. Measurement of the frequency of these bands should yield direct information on the strength of the interaction between the adsorbate and the adsorbent.
© (1985) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Norman A. Wright, Norman A. Wright, Peter R. Griffiths, Peter R. Griffiths, } "Triple Modulation FT-IR Spectrometry for Surface Analysis in the Far Infrared Region", Proc. SPIE 0553, Fourier and Computerized Infrared Spectroscopy, (20 December 1985); doi: 10.1117/12.970829; https://doi.org/10.1117/12.970829
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