20 December 1985 Two Dimensional Fourier Transform Infrared (FTIR) Mapping
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Proceedings Volume 0553, Fourier and Computerized Infrared Spectroscopy; (1985); doi: 10.1117/12.970802
Event: 1985 International Conference on Fourier and Computerized Infrared Spectroscopy, 1985, Ottawa, Canada
Abstract
A simple device for the two dimensional IR mapping of curved surfaces was developed and interfaced to a diffuse reflectance attachment for an FTIR spectrometer. The device consists of a mounting frame coupled to a micrometer driven translation stage. The sample is longitudinally driven through the focal point of the diffuse reflection attachment. By combining translations with rotations, a two dimensional matrix of spectra from the surface is acquired. The spatial resolution of these spectra approaches 1 mm. A two dimensional mapping of an electrical contact surface reveals an inhomogeneous distribution of a hydrocarbon species (the lubricant) and the presence of a contaminant containing a cyano group.
© (1985) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
R . L. Mowery, R. R . Smardzewski, "Two Dimensional Fourier Transform Infrared (FTIR) Mapping", Proc. SPIE 0553, Fourier and Computerized Infrared Spectroscopy, (20 December 1985); doi: 10.1117/12.970802; https://doi.org/10.1117/12.970802
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KEYWORDS
FT-IR spectroscopy

Infrared radiation

Infrared spectroscopy

Diffuse reflectance spectroscopy

Spectroscopy

Absorption

Ions

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