PROCEEDINGS VOLUME 0556
29TH ANNUAL TECHNICAL SYMPOSIUM | 20-23 AUGUST 1985
Intl Conf on Speckle
IN THIS VOLUME

1 Sessions, 48 Papers, 0 Presentations
All Papers  (48)
29TH ANNUAL TECHNICAL SYMPOSIUM
20-23 August 1985
San Diego, United States
All Papers
Proc. SPIE 0556, A Random Walk through the Field of Speckle, 0000 (25 November 1985); doi: 10.1117/12.949515
Proc. SPIE 0556, About Speckle, 0000 (25 November 1985); doi: 10.1117/12.949516
Proc. SPIE 0556, Electromagnetic Study Of Speckle, 0000 (25 November 1985); doi: 10.1117/12.949517
Proc. SPIE 0556, Properties Of Clipped Laser Speckle, 0000 (25 November 1985); doi: 10.1117/12.949518
Proc. SPIE 0556, The Cauchy/Schwarz Inequality As A Constraint In Power Spectrum/Autocorrelation Analysis And Image Reconstruction, 0000 (25 November 1985); doi: 10.1117/12.949519
Proc. SPIE 0556, Small-N Speckle: Phase-Contrast Approach, 0000 (25 November 1985); doi: 10.1117/12.949520
Proc. SPIE 0556, Structural Aspects Of Dichromatic Laser Speckle Patterns: Light Scattering From Polymer Films, 0000 (25 November 1985); doi: 10.1117/12.949521
Proc. SPIE 0556, Diffuser Transmission Functions And Far-Zone Speckle Patterns, 0000 (25 November 1985); doi: 10.1117/12.949522
Proc. SPIE 0556, Characterization Of Random Rough Surfaces From Measurements Of The Speckle Intensity, 0000 (25 November 1985); doi: 10.1117/12.949523
Proc. SPIE 0556, Statistical Properties of the Speckle Phase in Image and Diffraction Fields, 0000 (25 November 1985); doi: 10.1117/12.949524
Proc. SPIE 0556, Strong Scattering By Surfaces Of Small Roughness, 0000 (25 November 1985); doi: 10.1117/12.949525
Proc. SPIE 0556, Speckle Metrology Techniques And Their Applications, 0000 (25 November 1985); doi: 10.1117/12.949526
Proc. SPIE 0556, On The Laws Of Laser Speckle Movement In Space, 0000 (25 November 1985); doi: 10.1117/12.949527
Proc. SPIE 0556, Speckle Polarization Investigated By Novel Ellipsometer, 0000 (25 November 1985); doi: 10.1117/12.949528
Proc. SPIE 0556, Retinal Blood-Flow Visualization And Measurement By Means Of Laser Speckle Photography, 0000 (25 November 1985); doi: 10.1117/12.949529
Proc. SPIE 0556, Stress Analysis Combining Speckle Metrology With Finite Element Modelling, 0000 (25 November 1985); doi: 10.1117/12.949530
Proc. SPIE 0556, Lens Testing Method Based On The Boiling Phenomenon Of Laser Speckle, 0000 (25 November 1985); doi: 10.1117/12.949531
Proc. SPIE 0556, Accelerated Laser-Speckle Strain Gauge, 0000 (25 November 1985); doi: 10.1117/12.949532
Proc. SPIE 0556, Optical Three-Dimensional Displacement Meter, 0000 (25 November 1985); doi: 10.1117/12.949533
Proc. SPIE 0556, Unified Approach to the Detection and Classification of Speckle Texture in Diagnostic Ultrasound, 0000 (25 November 1985); doi: 10.1117/12.949534
Proc. SPIE 0556, Analysis Of Ultrasound Image Texture Via Generalized Rician Statistics, 0000 (25 November 1985); doi: 10.1117/12.949535
Proc. SPIE 0556, Digital Image Correlation Of White Light Speckle Including The Effects Of Image Distortion, 0000 (25 November 1985); doi: 10.1117/12.949536
Proc. SPIE 0556, Speckle Suppression and Analysis for Synthetic Aperture Radar Images, 0000 (25 November 1985); doi: 10.1117/12.949537
Proc. SPIE 0556, Speckle Effects on Coherent Laser Radar Detection Efficiency, 0000 (25 November 1985); doi: 10.1117/12.949538
Proc. SPIE 0556, Information Content Of Images Degraded By Speckle Noise, 0000 (25 November 1985); doi: 10.1117/12.949539
Proc. SPIE 0556, Use Of Matched Filtering To Identify Speckle Locations, 0000 (25 November 1985); doi: 10.1117/12.949540
Proc. SPIE 0556, The Use of Speckle for Determining the Response Characteristics of Doppler Imaging Radars, 0000 (25 November 1985); doi: 10.1117/12.949541
Proc. SPIE 0556, Speckle Reduction In Microwave Imaging By The CLEAN Technique, 0000 (25 November 1985); doi: 10.1117/12.949542
Proc. SPIE 0556, Geometric Filter For Reducing Speckle, 0000 (25 November 1985); doi: 10.1117/12.949543
Proc. SPIE 0556, Speckle Correlation And The Detection Of Phase Gratings Hidden By Diffusers, 0000 (25 November 1985); doi: 10.1117/12.949544
Proc. SPIE 0556, Phase-only Image Reconstruction From Offset Fourier Data, 0000 (25 November 1985); doi: 10.1117/12.949545
Proc. SPIE 0556, Speckle Interferometry, Image Reconstruction By Speckle Masking, Speckle Spectroscopy, Multiple-Mirror Interferometry, 0000 (25 November 1985); doi: 10.1117/12.949546
Proc. SPIE 0556, IR Background Speckle Noise Induced by Adaptive Optics in Astronomical Telescopes, 0000 (25 November 1985); doi: 10.1117/12.949547
Proc. SPIE 0556, Images From Astronomical Speckle Data: Weighted Shift-and-Add Analysis, 0000 (25 November 1985); doi: 10.1117/12.949548
Proc. SPIE 0556, Generalization Of Shift-And-Add Imaging, 0000 (25 November 1985); doi: 10.1117/12.949549
Proc. SPIE 0556, Roll Deconvolution Of Space Telescope Data: Inverse Filtering Of Two Speckle Interferograms, 0000 (25 November 1985); doi: 10.1117/12.949550
Proc. SPIE 0556, Astronomical Speckle Interferometry In The Infrared, 0000 (25 November 1985); doi: 10.1117/12.949551
Proc. SPIE 0556, Statistical Analysis of the Weighted Shift and Add Image Reconstruction Technique, 0000 (25 November 1985); doi: 10.1117/12.949552
Proc. SPIE 0556, Differential Speckle Imaging With The Cophased Multiple Mirror Telescope, 0000 (25 November 1985); doi: 10.1117/12.949553
Proc. SPIE 0556, Pupil And Image Plane Interferometry At Optical Wavelengths: Visibility And Phase Analysis., 0000 (25 November 1985); doi: 10.1117/12.949555
Proc. SPIE 0556, Cross-spectrum Techniques Applied To Astronomical Speckle Interferometry, 0000 (25 November 1985); doi: 10.1117/12.949556
Proc. SPIE 0556, Visualization Of Velocity Field By Single Exposure Holospeckle Interferometry, 0000 (25 November 1985); doi: 10.1117/12.949557
Proc. SPIE 0556, Statistical Properties And Application Of Two-Wavelength Speckles, 0000 (25 November 1985); doi: 10.1117/12.949558
Proc. SPIE 0556, Computer Generated Fringe Patterns In Speckle Analysis, 0000 (25 November 1985); doi: 10.1117/12.949559
Proc. SPIE 0556, Speckle-Interferometer Based Electro-Optic Displacement Sensor, 0000 (25 November 1985); doi: 10.1117/12.949560
Proc. SPIE 0556, Phase-Shifting Speckle Interferometry, 0000 (25 November 1985); doi: 10.1117/12.949561
Proc. SPIE 0556, Sandwich Holospeckle Interferometry For 3D Displacement Determination, 0000 (25 November 1985); doi: 10.1117/12.949562
Proc. SPIE 0556, Role Of Interference Fringe Intensity Fluctuations In The Study Of Speckle, 0000 (25 November 1985); doi: 10.1117/12.949563
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