25 November 1985 Accelerated Laser-Speckle Strain Gauge
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Abstract
An improved version of the laser speckle strain gauge is presented in which speckle displacement caused by deformation of a laser illuminated object is detected in real time using new photodetectors in place of linear image sensors and microcomputer in the conventional version. The detector, called a spatial filtering detector with electronic scanning facility, produces a voltage directly proportional to speckle displacement. Therefore, this strain gauge, which utilizes differential speckle displacement, delivers a voltage that is proportional to surface strain. It has a strain sensitivity of a few mV/microstrain. We applied this gauge to strain measurements of high-polymer films in various directions under loading at frequencies up to several tens of Hz and were able to evaluate their Poisson's ratios.
© (1985) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Ichirou Yamaguchi, Ichirou Yamaguchi, Takeo Furukawa, Takeo Furukawa, Toshitsugu Ueda, Toshitsugu Ueda, Eiji Ogita, Eiji Ogita, } "Accelerated Laser-Speckle Strain Gauge", Proc. SPIE 0556, Intl Conf on Speckle, (25 November 1985); doi: 10.1117/12.949532; https://doi.org/10.1117/12.949532
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