25 November 1985 Speckle Polarization Investigated By Novel Ellipsometer
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Abstract
A novel ellipsometric method is introduced for the analysis of speckle patterns. The method is based on the illumination of the scattering object by a plane-polarized light beam with its polarization plane rotating. The speckle pattern produced by the scattered light is then investigated for its polarization characteristics. An approximate theory is outlined and compared with experimental measurements demonstrating the usefulness of the method as a powerful surface analytic tool.
© (1985) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Joseph Shamir, "Speckle Polarization Investigated By Novel Ellipsometer", Proc. SPIE 0556, Intl Conf on Speckle, (25 November 1985); doi: 10.1117/12.949528; https://doi.org/10.1117/12.949528
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