25 November 1985 Statistical Properties of the Speckle Phase in Image and Diffraction Fields
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Abstract
The speckle phases are studied statistically in both image and diffraction fields. The general analysis for these studies is given by introducing an optical "system function" and the results are applied to the analysis of the speckle phases in both fields. The speckle phase distributions are evaluated by a phase angle defined as the extent of the equi-probability density ellipse stretched from the origin in the complex plane of the speckle amplitude.
© (1985) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
N. Takai, H. Kadono, T. Asakura, "Statistical Properties of the Speckle Phase in Image and Diffraction Fields", Proc. SPIE 0556, Intl Conf on Speckle, (25 November 1985); doi: 10.1117/12.949524; https://doi.org/10.1117/12.949524
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