PROCEEDINGS VOLUME 0557
29TH ANNUAL TECHNICAL SYMPOSIUM | 20-23 AUGUST 1985
Automatic Inspection and Measurement
IN THIS VOLUME

1 Sessions, 23 Papers, 0 Presentations
All Papers  (23)
29TH ANNUAL TECHNICAL SYMPOSIUM
20-23 August 1985
San Diego, United States
All Papers
Proc. SPIE 0557, Development Of An Automated Image Shearing Microscope For Measuring The Critical Dimensions Of Magnetic Recording Heads., 0000 (19 December 1985); doi: 10.1117/12.966251
Proc. SPIE 0557, Design of Robot Hand-Based Intelligent Sensor for Measuring Six DOF Force/Torque Information, 0000 (19 December 1985); doi: 10.1117/12.966252
Proc. SPIE 0557, Stress Sensor, 0000 (19 December 1985); doi: 10.1117/12.966253
Proc. SPIE 0557, Hardware For High Speed Boundary Encoding From Large Line Scanned Images, 0000 (19 December 1985); doi: 10.1117/12.966254
Proc. SPIE 0557, A Practical Architecture For Machine Vision Based Measurement And Inspection, 0000 (19 December 1985); doi: 10.1117/12.966255
Proc. SPIE 0557, Intelligent Visual Inspection Machines, 0000 (19 December 1985); doi: 10.1117/12.966256
Proc. SPIE 0557, An Automatic Visual Alignment and Inspection Station for Tape Automated Bonding (TAB) Products, 0000 (19 December 1985); doi: 10.1117/12.966257
Proc. SPIE 0557, SAIL - A High Level Programming Language Translator for Visual Inspection of Industrial Assemblies, 0000 (19 December 1985); doi: 10.1117/12.966258
Proc. SPIE 0557, Multiprocessor Architectures for Automated Inspection Systems, 0000 (19 December 1985); doi: 10.1117/12.966259
Proc. SPIE 0557, A Digital Wafer Image and Geometry Processor, 0000 (19 December 1985); doi: 10.1117/12.966260
Proc. SPIE 0557, SMV - A Computer Vision Program for Loading Surface Mount Components, 0000 (19 December 1985); doi: 10.1117/12.966261
Proc. SPIE 0557, Optimal Utilization Of A State-Of-The-Art Machine Vision Architecture, 0000 (19 December 1985); doi: 10.1117/12.966262
Proc. SPIE 0557, High-Speed Processing For Automatic Visual Inspection And Measurement., 0000 (19 December 1985); doi: 10.1117/12.966263
Proc. SPIE 0557, Turnkey Optical Inspection Systems: Getting What You Want, 0000 (19 December 1985); doi: 10.1117/12.966264
Proc. SPIE 0557, Description Of A New High Accuracy Method Of Angle Measurement By Multireflected Autocollimation, 0000 (19 December 1985); doi: 10.1117/12.966265
Proc. SPIE 0557, Measures of Circularit for Automatic Inspection Applications, 0000 (19 December 1985); doi: 10.1117/12.966266
Proc. SPIE 0557, A Microprogrammable Processor For Image Operations, 0000 (19 December 1985); doi: 10.1117/12.966267
Proc. SPIE 0557, Investigation On The Second Optical Inspection Of ICs, 0000 (19 December 1985); doi: 10.1117/12.966268
Proc. SPIE 0557, Real-Time Automatic Inspection Of Web Materials, 0000 (19 December 1985); doi: 10.1117/12.966269
Proc. SPIE 0557, Automated Inspection Of Magnetic Media By Laser Scanning, 0000 (19 December 1985); doi: 10.1117/12.966270
Proc. SPIE 0557, Remote Visual Inspection Of Nuclear Fuel Pellets With Fiber Optics And Video Image Processing, 0000 (19 December 1985); doi: 10.1117/12.966271
Proc. SPIE 0557, On-line Visual Inspection Of Automobile Display Panels, 0000 (19 December 1985); doi: 10.1117/12.966272
Proc. SPIE 0557, On the Forecasting of Lathe Cutting Dynamics(1), 0000 (19 December 1985); doi: 10.1117/12.966273
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